Sections
Left Column
Right Column
Text Area
- Chemical vapor deposition system
- Photoluminescence system
- Physical property measurement system
- PS-OPA tunable laser system
- Scanning electron microscope
- Semiconductor device characterization facilities
- SQUID
- Transmission electron microscope (TEM)
- Ultra-high vacuum scanning tunneling microscope
- Vacuum deposition system
- XPS and Auger surface analysis system
- PC cluster
- Oxford SpectroMag 4000 system
- Cluster deposition system
- Differential scanning calorimetry
- Femtosecond laser system
- Focused ion beam system
- Low energy electron microscope (LEEM)
- Magnetron sputtering system
- Micro Raman system
- Modulated photo-reflectance system
- Molecular beam epitaxy (MBE) system
- Oxford SpectroMag 2000 system
- Materials Characterization & Preparation facility (MCPF)